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Hagiwara, Rika*; Matsumoto, Kazuhiko*; Tsuda, Tetsuya*; Ito, Yasuhiko*; Kohara, Shinji*; Suzuya, Kentaro; Matsumoto, Hajime*; Miyazaki, Yoshinori*
Journal of Non-Crystalline Solids, 312-314, p.414 - 418, 2002/10
Times Cited Count:32 Percentile:85.82(Materials Science, Ceramics)The structures of a series of XF2.3HF (X= 1-methylimidazolium (MI), 1-ethyl-3-methylimidazolium (EMI), 1-butyl-3-methylimidazolium (BMI), 1-hexyl-3-methyl-imidazolium (HMI)) room temperature molten salts have been investigated by high-energy synchrotron X-ray diffraction technique. The correlation peaks appeared in the total correlation function are mainly ascribed to intra-molecular correlation of alkylimidazolium cations. However, it is suggested that the peak at around 3.6 is ascribed not only to intra-molecular but also inter-molecular correlation of the cation. The contribution of the latter is also supported by the first sharp diffraction peak of the total structure factor found at almost the same position as that of a Bragg peak in the simulated X-ray diffraction pattern of solid EMIFHF with a layered structure, corresponding to the layer separation of
Suzuya, Kentaro; Kohara, Shinji*
Materia, 41(3), p.206 - 215, 2002/03
With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30 keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of network forming glasses, SiO, BO, and GeO by the reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.
Kohara, Shinji*; Suzuya, Kentaro
Physics and Chemistry of Glasses, Vol.43C 2002, p.51 - 54, 2002/00
With the arrival of the latest generation of synchrotron sources and the introduction of advanced insertion devices, the high-energy (E 30keV) X-ray diffraction technique has become feasible, leading to new approaches in the quantitative study of the structure of disordered materials. Recently, the high-energy X-ray diffraction data have been combined with neutron diffraction data from a pulsed source to provide more detailed and reliable structural information than that hitherto available. We have developed a two-axis diffractometer for glass, liquid and amorphous materials at the SPring-8 high-energy X-ray diffraction beamline BL04B2. Furthermore, we have succeeded to analyze the intermediate-range order of a typical network forming glass, silica (SiO), by reverse Monte Carlo (RMC) modelling technique with special focused on the ring structures using both high-energy X-ray and neutron diffraction data.